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Articles by keyword: «Zeeman»

• Photoluminescence Measurements of a Beryllium-Related Deep Center in Silicon
  Published in: Shallow Impurities in Semiconductors V (p177)
• Properties of the Bound Excitons Associated to the 3838Å Line in 4H-SiC and the 4182Å Line in 6H-SiC
  Published in: Silicon Carbide and Related Materials 2003 (p549)
• The Orthorhombic FeIn Complex in Silicon
  Published in: Defects in Semiconductors 19 (p455)
• Zeeman and Landau Spectroscopy of Group III Acceptors in Germanium
  Published in: Shallow Impurities in Semiconductors V (p123)
• Zeeman and Piezo-Zeeman Spectroscopy of Zinc and Copper Acceptors in Germanium
  Published in: Shallow Impurities in Semiconductors V (p129)
• Zeeman Study of 735meV Photoluminescence Band in Iron-Doped Silicon
  Published in: Shallow Impurities in Semiconductors V (p255)