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Search for: «x-ray Bias Correction.»

• A380 V: Dislocations and Point Defects
• p1324 Processing, Archiving and Management of Digital Image from X-Ray Flat-Panel Detector
  Authors: Zheng Gan Zhou, Juan Chen, Zhen Gang An
• p799 Synthetic Aperture Radar: From Signal to Image
  Authors: Sunghee Kwak, Youngran Lee, Dong Seok Shin, Won Kyu Park
• p35 Integration of Intensity and Angle Calibration into Rietveld Refinement
  Authors: J. Schneider, A. Kern
• p995 Improved Efficiency in Power Factor Correction Circuits with a pn-Gated SiC FET
  Authors: Robin L. Kelley, Michael S. Mazzola, William L. Draper
• p171 Residual Stress Error Introduced by Truncated Patterns: Prediction and Correction
  Authors: C. Ferreira, Manuel François, Ronald Guillén
• p567 Microstructure Gradients in PVD-TiN Coatings
  Authors: K. Fischer, H. Oettel
• p53 Detection Properties of CdZnTe Semiconductor for Diagnostic X-Ray Spectroscopic Applications
  Authors: M.B. Freitas, F.H.M. Medeiros, E.M. Yoshimura
• p209 Reconstruction of Impact Loads within Fibre Reinforced Polymers
  Authors: Ch.R. Koenig, D.H. Mueller, O. Focke, Mircea Calomfirescu
• A341 TiN: Ion Bombardment, Point Defects, and Defect Annealing