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Search for: «Nanodiamond Lateral Field Emission Diode Devices»

• A86 SiC: Dislocations
• p1007 OBIC Analysis of Different Edge Terminations of Planar 1.6 kV 4H-SiC Diodes
  Authors: Christophe Raynaud, Daniel Loup, Phillippe Godignon, Raul Perez Rodriguez, Dominique Tournier, Dominique Planson
• A714 Point Defects: Defect-Induced Degradation
• A420 (Cd,Zn)Se/Zn(S,Se): Dislocations
• p909 Coupling between the Raman Spectroscopy and Photoemission Microscopy Techniques: Investigation of Defects in Biased 4H-SiC pin Diodes
  Authors: Aurelie Thuaire, Michel Mermoux, Edwige Bano, Alexandre Crisci, Francis Baillet, K. Zekentes
• A25 AlGaN/GaN: Dislocations
• p687 Electroluminescence From Implanted and Epitaxially Grown pn-Diodes
  Authors: F.H.C. Carlsson, L. Storasta, C. Hemmingsson, J.Peder Bergman, Erik Janzén
• A294 GaN: Dislocations
• p3677 A Novel Efficient Blue Organic Light Emitting Structure
  Authors: Wen Long Jiang, Yu Duan, Yi Zhao, Jingying Hou, Shi Yong Liu
• A143 AlGaN/GaN: Dislocations