You wanted to download
Photo-Acoustic Displacement Measurements for Characterization of Subsurface Defects in Silicon
There are three ways to get it:
-
Subscription for unlimited downloads of all papers and abstracts on www.scientific.net (US$ 98,- / € 71,- per month)
-
Single paper «Photo-Acoustic Displacement Measurements for Characterization of Subsurface Defects in Silicon» only (US$ 28,- / € 20,-)
-
Librarians: Are you interested in IP Access, please use this form