Search for: «ESR characterization of SiC bulk crystals and SiO/sub 2/SiC interface»

p573 Low Temperature Brittle Fracture in C-Mn Weld Metal
Authors: F.H. Baumann, R. Moskovic, R.K. Wild, P.E.J. Flewitt
p1025 ESR Characterization of SiC Bulk Crystals and SiO₂/SiC Interface
Authors: J. Isoya, Ryouji Kosugi, Kenji Fukuda, Satoshi Yamasaki
p1713 Electron Spin Resonance Features of the P_b1 Interface Defect in Thermal (100)Si/SiO₂
Authors: Andre Stesmans, Valery V. Afanas'ev
p1329 A Photoemission Study of Polar and Non-Polar SiC Surfaces Oxidized in N₂O
Authors: Leif I. Johansson, Charíya Virojanadara, Th. Eickhoff, W. Drube
p51 Preparation of Semi-Insulating Silicon Carbide by Vanadium Doping during PVT Bulk Crystal Growth
Authors: Matthias Bickermann, Dieter Hofmann, Thomas L. Straubinger, Roland Weingärtner, Albrecht Winnacker
p477 Spin Dependent Recombination at Deep-Level Centers in 6H Silicon Carbide/Silicon Metal Oxide Semiconductor Field Effect Transistors
Authors: David J. Meyer, N.A. Bohna, Patrick M. Lenahan, Aivars J. Lelis
p1011 Observation of Deep-Level Centers in 4H-Silicon Carbide Metal Oxide Semiconductor Field Effect Transistors by Spin Dependent Recombination
Authors: Morgan S. Dautrich, Patrick M. Lenahan, Aivars J. Lelis
p1 Buried SiO₂ Films: Interfaces and Defects
Authors: Andre Stesmans
p517 Formation and Properties of Thermal Donors Generated by Prolonged Annealing in Si Crystals with Different Oxygen and Carbon Contents
Authors: V.M. Babich, N.P. Baran, A.A. Bugai, V.B. Kovalchuk, V.M. Maksimenko, B.D. Shanina
A163 SiC/SiO₂ : Interface Defects