Search for: «Equilibrium critical thickness of strained buried SiGe layers»

p627 Internal Friction Characterization of Metal Matrix Composites
Authors: L. Parrini, R. Schaller
p149 Equilibrium Critical Thickness of Strained Buried SiGe Layers
Authors: A. Fischer, G. Kissinger, Hans Richter, P. Zaumseil
p463 Strained Silicon on Ultrathin Silicon-Germanium Virtual Substrates
Authors: Klara Lyutovich, Erich Kasper, Michael Oehme, Jens Werner, Tatiana Perova
A35 GeSi/Si: Dislocations
A454 Stresses due to Arrays of Dislocations in an Anisotropic Half Space
p457 Investigation of SiGe/Si - Heterostructures with High Resolution X-Ray Diffraction Methods
Authors: K. Frohberg, B. Wehner, B. Trui, K. Wolf, P. Paufler, H. Kück
p1 Towards SiGe Terahertz VCSELs
Authors: R.W. Kelsall, Z. Ikonić, P. Harrison, D.J. Paul, S.A. Lynch, R. Bates, D.J. Norris, S.L. Liew, A.G. Cullis, D.D. Arnone, C.R. Pidgeon, P. Murzyn, D.J. Robbins, R.A. Soref
p27 Silicon Based Heterostructures: Advances in Channel Materials
Authors: Erich Kasper
p451 Characterization of SiGe Layer on Insulator by In-Plane Diffraction Method
Authors: M. Imai, Y. Miyamura, D. Murata, A. Ogi
p797 Thin SiGe Relaxed Buffer for Strain Adjustment
Authors: Erich Kasper, Klara Lyutovich