Search for: «SiC Power MOSFETs – Status, Trends and Challenges»

p573 Low Temperature Brittle Fracture in C-Mn Weld Metal
Authors: F.H. Baumann, R. Moskovic, R.K. Wild, P.E.J. Flewitt
p627 Internal Friction Characterization of Metal Matrix Composites
Authors: L. Parrini, R. Schaller
p1255 SiC Power MOSFETs – Status, Trends and Challenges
Authors: Dethard Peters, Reinhold Schoerner, Peter Friedrichs, Dietrich Stephani
p2948 Low-Temperature Sintering of Nanoscale Silver Paste for Large-Area Joints in Power Electronics Modules
Authors: Thomas G. Lei, Jesus Calata, Shu Fang Luo, Guo Quan Lu, Xu Chen
p1155 SiC and GaN High-Voltage Power Switching Devices
Authors: T.P. Chow
p827 Realization of Low On-Resistance 4H-SiC Power MOSFETs by Using Retrograde Profile in P-Body
Authors: Keiko Fujihira, Naruhisa Miura, Tomokatsu Watanabe, Yukiyasu Nakao, Naoki Yutani, Ken Ichi Ohtsuka, Masayuki Imaizumi, Tetsuya Takami, Tatsuo Oomori
p1283 Effect of Off-Angle from Si (0001) Surface and Polytype on Surface Morphology of SiC and C-V Characteristics of SiC MOS Structures
Authors: Kenji Fukuda, Seiji Suzuki, Junji Senzaki, Ryouji Kosugi, Kiyoko Nagai, Toshihiro Sekigawa, Hideyo Okushi, Sadafumi Yoshida, Tomoyuki Tanaka, Kazuo Arai
p1263 The SiC-SiO₂ Interface: A Unique Advantage of SiC as a Wide Energy-Gap Material
Authors: Sima Dimitrijev
p895 Critical Technical Issues in High Voltage SiC Power Devices
Authors: Anant Agarwal, Al A. Burk, Robert Callanan, Craig Capell, Mrinal K. Das, Sarah K. Haney, Brett A. Hull, Charlotte Jonas, Michael J. O'Loughlin, Michael O`Neil, John Palmour, Adrian R. Powell, James Richmond, Sei Hyung Ryu, Robert E. Stahlbush, Joseph J. Sumakeris, Jon Zhang
p907 Challenges of 4H-SiC MOSFETs on the C(000-1) Face toward the Achievement of Ultra Low On-Resistance
Authors: Kenji Fukuda, Shinsuke Harada, Junji Senzaki, Mitsuo Okamoto, Yasunori Tanaka, Akimasa Kinoshita, Ryouji Kosugi, Kazu Kojima, Makoto Kato, Atsushi Shimozato, Kenji Suzuki, Yusuke Hayashi, Kazuto Takao, Tomohisa Kato, Shin Ichi Nishizawa, Tsutomu Yatsuo, Hajime Okumura, Hiromichi Ohashi, Kazuo Arai