Search for: «silicon permittivity»

p241 Energy Loss of O1s Photoelectrons in Compositional and Structural Transition Layer at and near the SiO₂/Si Interface
Authors: H. Nohira, Kunimasa Takahashi, Takeshi Hattori
p245 Metal Enhanced Oxidation of Silicon
Authors: M. Börner, N. Junghans, S. Landau, B.O. Kolbesen
p233 Role of UV/Chlorine Exposure during Dry Surface Conditioning before Integrated Epi Deposition Process
Authors: J. Ruzyllo, Erika Röhr, M. Caymax, M. Baeyens, Thierry Conard, Paul W. Mertens, Marc M. Heyns
p211 Kelvin-SPV Measurements of Atomically-Flat Si(111) Surfaces Contaminated with Metallic Ions
Authors: T. Tagawa, Tsugunori Okumura
p249 Effect of Si Surface Roughness on the Current-Voltage Characteristics of Ultra-Thin Gate Oxides
Authors: M. Houssa, T. Nigam, Paul W. Mertens, Marc M. Heyns
p1625 Improvement of Cavitation Resistance of Stainless Steels by Solution Nitriding
Authors: A. Kühl, Hans Berns, S. Siebert
p45 Use of the Nitride to Reduce High-K Secondary Effects in Submicron MOSFETs
Authors: Y. Amhouche, K. Rais
p477 Improved Extraction of Si Substrate Parameters from Combined I-V and C-V Measurements on P-N Junction Diodes
Authors: A. Czerwinski, Eddy Simoen, Jan Vanhellemont, D. Tomaszewski, J. Gibki, A. Bakowski
p251 Dielectric Measurement of BaTiO₃ Powder and Its Statistical Analysis
Authors: Takashi Sekine, Takuya Hoshina, Song Min Nam, Hiroaki Yasuno, Hirofumi Kakemoto, Satoshi Wada, Takaaki Tsurumi
A446 ZnS: Dislocations and Grain Boundaries