Research on the Multi-Objective Optimization Model of System-Level BIT Testability Index Determination

Abstract:

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By weighing reliability, maintainability, availability and life-cycle cost of equipment which are influenced by testability,the testability indexes of system level BIT are determined on the basis of maximum system reliability & maintainability and minimum the life-circle cost. The influence mathematical models of system reliability, maintainability, availability and life-circle cost are established. According to these mathematical models, the multi-objective optimization model of system-level BIT testability indexes is established. The multi-objective optimization model is solved using Non-dominated Sorting Genetic Algorithm II, and the validity of the multi-objective optimization model is proved through an example.

Info:

Periodical:

Edited by:

Dongye Sun, Wen-Pei Sung and Ran Chen

Pages:

2223-2227

DOI:

10.4028/www.scientific.net/AMM.121-126.2223

Citation:

C. S. Zhu et al., "Research on the Multi-Objective Optimization Model of System-Level BIT Testability Index Determination", Applied Mechanics and Materials, Vols. 121-126, pp. 2223-2227, 2012

Online since:

October 2011

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Price:

$35.00

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