Research on the Multi-Objective Optimization Model of System-Level BIT Testability Index Determination
By weighing reliability, maintainability, availability and life-cycle cost of equipment which are influenced by testability，the testability indexes of system level BIT are determined on the basis of maximum system reliability & maintainability and minimum the life-circle cost. The influence mathematical models of system reliability, maintainability, availability and life-circle cost are established. According to these mathematical models, the multi-objective optimization model of system-level BIT testability indexes is established. The multi-objective optimization model is solved using Non-dominated Sorting Genetic Algorithm II, and the validity of the multi-objective optimization model is proved through an example.
Dongye Sun, Wen-Pei Sung and Ran Chen
C. S. Zhu et al., "Research on the Multi-Objective Optimization Model of System-Level BIT Testability Index Determination", Applied Mechanics and Materials, Vols. 121-126, pp. 2223-2227, 2012