Built-in Self-Test Design for Fault Detection of MUXFXs in SRAM-Based FPGAs

Abstract:

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This paper proposes a built-in self-test (BIST) design for MUXFXs in SRAM-based FPGAs. This approach can test both the interconnect resources and MUXFXs in the configurable logic blocks (CLBs). Because the test pattern generator (TPG) and output response analyzer (ORA)are configured by existing CLBs in FPGAs, no extra area overhead is needed for the proposed BIST structure. Open/short , stuck on/off faults in PSs, and stuck-at-0/1 faults in MUXFXs will be detected through the target fault detection/diagnosis of the proposed BIST structure.

Info:

Periodical:

Edited by:

Yuanzhi Wang

Pages:

220-225

DOI:

10.4028/www.scientific.net/AMM.39.220

Citation:

S. Hong et al., "Built-in Self-Test Design for Fault Detection of MUXFXs in SRAM-Based FPGAs", Applied Mechanics and Materials, Vol. 39, pp. 220-225, 2011

Online since:

November 2010

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Price:

$35.00

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