Grid-Based Method and Wavelet Transform Fusion of Rapid Detection of Fabric Defects


Article Preview

For rapid detection of defects, this paper selected by the grid method in the whole image defect in the area, and then use the grid template to a defect in the image area can not be narrowed down to so far, and there is only a small area defect image processing. Detection of small defects in the fabric, through the Wavelet transform and other image enhancement comparison and the fabric defect detection experiment found that wavelet transform for image enhancement characteristics of a local image enhancement processing, can achieve better detection of weak targets the effect of small fabric defect detection to improve accuracy and efficiency, real time, to achieve rapid industrial fabric defect detection requirements.



Edited by:

Zhenyu Du and Bin Liu




Z. Q. Kang et al., "Grid-Based Method and Wavelet Transform Fusion of Rapid Detection of Fabric Defects", Applied Mechanics and Materials, Vol. 65, pp. 48-51, 2011

Online since:

June 2011




[1] Sar Sary, Lamyarni Ibrahim, Yoshizumi Yasuda. An application of vision system for the identification and defection on woven fabrics by using artificial neural network, Proceedings of 1993 international joint conference on neural networks, 1993, 3: 2141-2144.


[2] W J Jasper, S J Garnier, H Potlapalli. Texture characterization and defect detection using adaptive wavelets. Optical Engineering, 1996, 35(11): 3140-3149.


[3] Li Liqing, Huang Xiubao. Recent studies on image-based automatic fabric inspection system [J]. Journal of Donghua University, Natural Science, 2002, 28 (4) : 118-122.

[4] A. Kano,K. Doi,H. MacMahon D.D. Hassell, and M.L. Giger, Digital image subtraction of temporallysequential chest images for detection of interval change, Med. Phys. vol. 21, pp.453-461, (1994).


[5] LU ISIER Florian, BLU Thierry. SURELET multichannel image denoising: interscale orthonormal wavelet thresholding [J]. IEEE Transactions on Image Processing, 2008, 17( 4) : 482-492.


[6] Jiang lei, Yi YeAn, Fabric Defects Based on Wavelet Analysis Method of Automatic Detection[J], Computer Engineering and Science, 2009 , 31(5) 49-52.

[7] Hu Yan, Zhang RuiLin, Morphology Based on Wavelet Transform and Edge Detection of fabric defects[J], Test and Measurement Technology, 2009, 23 (2) : 173-177.