Analytical Processing Development of Tin Element Using Wavelength Dispersion X-Ray Fluorescence (WDXRF) Technique

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The aim of this work was to develop technical analysis of wavelength dispersion X-ray fluorescence (WDXRF) and compare with technical neutron activation analysis (NAA). First, the standard of tin oxide (SnO) was ground into powder and mixed with boric acid (H3BO3) as binder at different weight. All of samples were investigated by WDXRF in normalize mode.The results indicated that the range can use to calibration at sample weight 0.2, 0.3 and 0.4 g. Next, the three SnO samples from different area (A, B and C) were ground, mixed with binder at ratio 0.2, 0.3 and 0.4 g and investigated by WDXRF in normalize mode. The results show tin (Sn) content of sample area A, B and C were 75.71, 74.61 and 71.01%, respectively. The result from NAA technique show Sn content of sample A, B and C were 79.36, 77.48 and 73.35%. The percentage error of WDXRF and NAA technique of the samples from the different area had 4.63, 3.70 and 3.19%. From the experiment as examined that the WDXRF technique could be improve process for determine chemical composition which one of choice for easy to used and low cost.

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Edited by:

Dr. Noppakun Sanpo, Dr. Jirasak Tharajak and Dr. Paisan Kanthang

Pages:

201-205

Citation:

N. Nuamsrinuan et al., "Analytical Processing Development of Tin Element Using Wavelength Dispersion X-Ray Fluorescence (WDXRF) Technique", Applied Mechanics and Materials, Vol. 879, pp. 201-205, 2018

Online since:

March 2018

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$38.00

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