Performance Test and Evaluation for Pixel CdZnTe Detector of Different Thickness

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Cadmium zinc telluride (CZT) material is one of the preferred materials for the fabrication of X-ray and gamma-ray detector. In this paper, it is presented an experimental detector system based on pixellated CZT semiconductor detector. The aim of this study is to get the photon energy suitable for different thickness detector, different photon energy acts on pixel CdZnTe detector of different thickness. We can obtain the energy spectrum estimation, energy resolution and peak efficiency by the experiment and simulation with the radiation source of 241Am and 137Cs acting on pixel CdZnTe detector. From experiment results, it can be found that at the high energy of 662keV the thicker CdZnTe detector is high. The characteristic of detector is better at the low energy when the detector thickness is thinner.

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Periodical:

Edited by:

Z.S. Liu, L.P. Xu, X.D. Liang, Z.H. Wang and H.M. Zhang

Pages:

101-104

Citation:

Z. L. Tang and M. Shen, "Performance Test and Evaluation for Pixel CdZnTe Detector of Different Thickness", Advanced Materials Research, Vol. 1015, pp. 101-104, 2014

Online since:

August 2014

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$38.00

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DOI: https://doi.org/10.1016/s0080-8784(08)62739-8

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