The Electrical Characteristics of GaAs-MgO Interfaces of GaAs MIS Schottky Diodes


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Many researches pay attention to the metal-semiconductor interface barrier, due to its effect on device. Deliberate growing an interface layer to affect and improve the quality of device, especially metal-insulator-semiconductor (MIS) structures, arouses wide attention. In this paper, Be-doped GaAs was grown on substrate wafer by molecular beam epitaxy (MBE) on purpose before depositing insulator layer, and then MgO film as the dielectric interface layer of Au/GaAs were deposited using atomic layer deposition (ALD) method. The interface electrical characteristics of the metal-insulator-semiconductor (MIS) structures were investigated in detail. The barrier height and ideal factor of GaAs diode parameters were calculated by means of current-voltage (I-V) characteristics. Experimental result showed that along with the increasing of the doping content, the Schottky barrier height increasing, but the ideal factor decrease at first and then increase.



Edited by:

Hailin Cong, Bing Yu and Xing Lu




X. Gao et al., "The Electrical Characteristics of GaAs-MgO Interfaces of GaAs MIS Schottky Diodes", Advanced Materials Research, Vol. 1118, pp. 270-275, 2015

Online since:

July 2015




* - Corresponding Author

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