Characteristic Investigation on Substructures of High Purity Al Rolled at Room Temperature
Micro-orientation data of a high purity Al rolled up to total thickness reduction of 80% at room temperature were determined using SEM-EBSD technique, conceptions of describing substructure information, such as subgrain misorientation (θcry), and average misorientation (θenv) of circumjacent subgrains for a special subgrain, etc., were suggested and corresponding GCDP-OI soft package was developed. It is found that the subgrains sizes increase rapidly from about 2 to 7 μm with increasing misorientations from 1° to 15°, and the total number frequency of which is more than 95%. However, taking into account local features of subgrais, whose sizes for Dcry/Denv > 1 are 2 times larger than that for Dcry/Denv < 1 on the same misorientation levels below 20°, and the relationships between misorientations and sizes are consistent with that if Dcry/Denv > 1, θcry/θenv > 1, vice versa.
T. Chandra, K. Tsuzaki, M. Militzer and C. Ravindran
X. Liang et al., "Characteristic Investigation on Substructures of High Purity Al Rolled at Room Temperature", Advanced Materials Research, Vols. 15-17, pp. 918-922, 2007