A classical Demerit control chart is used to monitor the process through which various types of defects in complex products, such as automobiles, computers, mobile phones, etc. are found in general. As a technique for rapidly detecting small shifts of the process mean in the control chart, the EWMA(exponentially weighted moving average) technique is very effective. This study suggested the Demerit-GWMA control chart, combining the GWMA(generally weighted moving average) technique, which shows better performance than EWMA technique in detecting small shifts of process mean, into the classical Demerit control chart, and evaluated its performance. Through the evaluation of its performance, it was found that the Demerit-GWMA control chart is more sensitive than both the classical Demerit control chart and the Demerit-EWMA control chart in detecting small shifts of process mean.