Automatic Inspection of Silk Fabric Density Based on Multi-Scale Wavelet Analysis

Abstract:

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Silk fabrics density are usually very high because the silk yarns are finer than spinning yarns, so it difficult to calculate the density quickly by routine methods. According to the characteristics of silk fabric, a method to measure silk fabric density based on multi-scale wavelet decomposition is developed in this study. The wavelet multi-scale analysis is an ideal approach to extract the detail features from the fabric images. And the results showed that this method is superior to normal wavelet decomposition. It is an efficient and accurate way to measure the density of common silk fabrics automatically.

Info:

Periodical:

Advanced Materials Research (Volumes 175-176)

Main Theme:

Edited by:

Lun Bai and Guo-Qiang Chen

Pages:

371-375

DOI:

10.4028/www.scientific.net/AMR.175-176.371

Citation:

J. Zhou and L. Q. Li, "Automatic Inspection of Silk Fabric Density Based on Multi-Scale Wavelet Analysis", Advanced Materials Research, Vols. 175-176, pp. 371-375, 2011

Online since:

January 2011

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Price:

$35.00

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