Shape Analysis of the Raw Silk Defects

Abstract:

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The detection of raw silk defects is important in the quality inspection of raw silk. Electronic inspection is a popular method now for the reasons of high speed and objectivity. However, the traditional seriplane testing method is also applied in many countries for its advantages that the electronic inspection method haven’t. Due to the different evaluation standards, different results will be derived when the same raw silk defect is detected by the two different methods. In this study, various raw silk defects were detected according to the two different methods or standards. The cause of different results derived by different detection method was analyzed through observing the actual shape of the raw silk defects under the microscope. This is favorable to the development of electronic inspection method and standards for the raw silk defects.

Info:

Periodical:

Advanced Materials Research (Volumes 175-176)

Main Theme:

Edited by:

Lun Bai and Guo-Qiang Chen

Pages:

429-433

DOI:

10.4028/www.scientific.net/AMR.175-176.429

Citation:

K. N. Xiao et al., "Shape Analysis of the Raw Silk Defects", Advanced Materials Research, Vols. 175-176, pp. 429-433, 2011

Online since:

January 2011

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Price:

$35.00

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