Stability and Performance of Virtual Reality-Based Telenanomanipulation System in SEM

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In this paper, a master/slave telenanomanipulation control system with force feedback is established with the micro-positioner (Attocube) working in scanning electron microscope (SEM) as the slave side and the haptic device (Omega3) as the master side. An improved virtual coupling (IVC) algorithm is introduced based on nanoscale virtual coupling (NSVC) by adding a proportional- plus-integral (PI) velocity controller in the haptic interface. The stability and performance of the established system are discussed. This method leads to an explicit design procedure for virtual coupling networks which give greatest performance while guaranteeing stability both on moving carbon nanowires in SEM and measuring force at the point of device-human contact.

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Periodical:

Advanced Materials Research (Volumes 183-185)

Edited by:

Yanguo Shi and Jinlong Zuo

Pages:

1746-1751

Citation:

D. J. Li et al., "Stability and Performance of Virtual Reality-Based Telenanomanipulation System in SEM", Advanced Materials Research, Vols. 183-185, pp. 1746-1751, 2011

Online since:

January 2011

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$38.00

[1] M. Sitti: Microscale and Nanoscale Robotics Systems, IEEE Robot. Autom. Mag., Vol. 14, No. 1 (2007), pp.53-60.

DOI: https://doi.org/10.1109/mra.2007.339606

[2] R. L. Hollis, S. Salcudean, and D. W. Abraham: Toward a Tele-nanorobotic Manipulation System with Atomic Scale Force Feedback and Motion Resolution, in Proc. IEEE Int. Conf. Micro Electro Mechanical Systems, (1990), pp.115-119.

DOI: https://doi.org/10.1109/memsys.1990.110261

[3] Sung-Gaun Kim and Metin Sitti. Task-Based and Stable Telenanomanipulation in a Nanoscale Virtual Environment, IEEE Transactions on Automation Science and Engineering, Vol. 3, No. 3 (2006), pp.240-247.

DOI: https://doi.org/10.1109/tase.2006.876909

[4] J. E. Colgate and G. Schenkel: Passivity of a Class of Sampled-data System: Application to Haptic Interfaces, in Proc. Amer. Control Conf., (1994), pp.3236-3240.

DOI: https://doi.org/10.1109/acc.1994.735172

[5] M. Sitti: Survey of Nanomanipulation Systems, Proc. of the IEEE Conf. on Naoteehnology, USA: the Institute of Electrical and Electronics Engineers, (2001), pp.75-80.

[6] C. D. Onal and M. Sitti: Teleoperated 3-D Force Feedback from the Nanoscale With an Atomic Force Microscope, IEEE Transactions on Nanotechnology, Vol. 9, No. 1 (2010), pp.46-54.

DOI: https://doi.org/10.1109/tnano.2009.2021472

[7] C. D. Onal and M. Sitti: A Scaled Bilateral Control System for Experimental One-dimensional Teleoperated Nanomanipulation, Int. J. Robot. Res., Vol. 28, No. 4 (2009), pp.484-497.

DOI: https://doi.org/10.1177/0278364908097773

[8] Y. Yokokohji and T. Yoshikawa: Bilateral Control of Master-Slave Manipulators for Ideal Kinesthetic Coupling, IEEE Int. Workshop on Intelligent Robots and Systems, (1990), pp.355-362.

DOI: https://doi.org/10.1109/iros.1990.262411

[9] M. C. Cavusoglu, A. Sherman, and F. Tendick: Design of Bilateral Teleoperation Controllers for Haptic Exploration and Telemanipulation of Soft Environments, IEEE Trans. Robot. Autom., Vol. 18, No. 4 (2002), pp.641-647.

DOI: https://doi.org/10.1109/tra.2002.802199

[10] N. Hogan: Controlling Impedance at the Man/machine Interface, in Proc. IEEE Int. Conf. Robotics and Automation, Vol. 3 (1989), pp.1626-1631.

[11] R. J. Adams and B. Hannaford, Stable Haptic Interaction with Virtual Environments, IEEE Trans. Robot. Autom., Vol. 15, No. 3 (1999), pp.465-474.

DOI: https://doi.org/10.1109/70.768179

[12] J. H. Ryu, Y. S. Kim, and B. Hannaford: Sampled and Continuous Time Passivity and Stability of Virtual Environments, IEEE Trans. on Robotics, Vol. 20-4 (2004), pp.772-776.

DOI: https://doi.org/10.1109/tro.2004.829453

[13] J. E. Colgate and J. Brown: Factors Affecting the Width of a Haptic Display, in Proc. IEEE Int. Conf. Robotics and Automation, San Diego, CA, (1994), pp.3205-3210.

[14] W. Vogl, B. Kai-Lam M, and M. Sitti: Augmented Reality User Interface for an Atomic Force Microscope-based Nanorobotic System, IEEE Trans. on Nanotechnology, Vol. 5-4 (2006), pp.397-406.

DOI: https://doi.org/10.1109/tnano.2006.877421