The Improved Algorithm of Scale Invariant Feature Transform on Palmprint Recognition

Abstract:

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This paper presents a new method of palmprint recognition based on improved scale invariant feature transform (SIFT) algorithm which combines the Euclidean distance and weighted sub-region. It has the scale, rotation, affine, perspective, illumination invariance, and also has good robustness to the target's motion, occlusion, noise and other factors. Simulation results show that the recognition rate of the improved SIFT algorithm is higher than the recognition rate of SIFT algorithm.

Info:

Periodical:

Edited by:

Wenya Tian and Linli Xu

Pages:

565-569

DOI:

10.4028/www.scientific.net/AMR.186.565

Citation:

Z. Qu and Z. Y. Wang, "The Improved Algorithm of Scale Invariant Feature Transform on Palmprint Recognition", Advanced Materials Research, Vol. 186, pp. 565-569, 2011

Online since:

January 2011

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Price:

$35.00

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