Improving Image Contrast of Fiber Point Diffraction Interferometer


Article Preview

To measure spherical surface with high precision, an advanced fiber point diffraction interferometer (FPDI) is introduced in this paper. Based on the system principle, the factors that affect the interference image contrast are put forward and analyzed, such as fiber optical properties, interferogram background and intensity match of two beams. Then the optimization method is proposed. The single-mode fiber with core diameter 3λ is selected and the dispersion between modes is removed. The short coherence length laser is designed with a semiconductor solid-state laser and meets the need of FPDI. By coating film on the fiber end face, the light use ratio is improved significantly. Finally, the fiber point diffraction interferometer system is set up in experiment and the interference fringes are obtained. The result shows that the FPDI can achieve interference patterns with high contrast after optimization and the system has reached a relatively high accuracy.



Edited by:

Yanwen Wu






L. Nie et al., "Improving Image Contrast of Fiber Point Diffraction Interferometer", Advanced Materials Research, Vol. 187, pp. 693-698, 2011

Online since:

February 2011




[1] Kazuya Ota, Takahiro Yamamoto, et al. Advanced point diffraction interferometer for EUV aspherical mirrors. Proceedings of SPIE, Vol. 4343, pp.543-550 (2001).

DOI: 10.1117/12.436686

[2] K. Otaki, F. Bonneau, et al. Absolute Measurement of spherical surface by point diffraction interferometer. Proceedings of SPIE, 3740, pp.602-605 (1999).

[3] R. N. Smartt and J. Strong. Point-diffraction interferometer. J. Opt. Soc. Amer, 62, pp.737-734 (1972).

[4] Liu Guogang, Zhang Xuejun, et al, Fiber point diffraction interferometer, Optics and Precision Engineering, 9(2), pp.142-145(2001).

[5] Nie Liang, Sha Dingguo, Chen Lingfeng. Analysis of diffraction wavefront for optical fiber point source. International Symposium on Test and Measurement, Vol. 4, pp.3214-3217(2005).

[6] Seung-Woo Kim, Byoung-Chang Kim, et al. Point-diffraction interferometer for 3-D profile measurement of rough surfaces. Proceedings of SPIE, 5191, pp.200-207 (2003).

DOI: 10.1117/12.507074

In order to see related information, you need to Login.