Electrochemical Properties of NiO thin Film Prepared by Sol-Gel Process


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The thermal decomposition behavior of gel precursor, the structure, morphology and electrochemical properties of NiO thin films prepared by sol-gel process were characterized by thermogravimetric/differential scanning calorimetry (TG-DSC), X-ray diffraction (XRD), scanning electron microscopy (SEM) and constant current charge-discharge techniques. The results show that the gel precursor completely decomposes and gradually forms the nanocrystalline NiO at 450°C during the sintering. The NiO thin film is smooth, uniform and free of cracks drying at 200°C as pretreatment and sintering at a low temperature rise rate. The structure of NiO films sintered at 500°C for 2h becomes integrity, whose discharge capacity after 20 cycles remains at 714mAh/g. It is promising to be used in Li-ion battery for great initial specific capacity and well cycle performances.



Advanced Materials Research (Volumes 194-196)

Edited by:

Jianmin Zeng, Taosen Li, Shaojian Ma, Zhengyi Jiang and Daoguo Yang




J. N. Zhu et al., "Electrochemical Properties of NiO thin Film Prepared by Sol-Gel Process", Advanced Materials Research, Vols. 194-196, pp. 2487-2490, 2011

Online since:

February 2011




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