Electrochemical Properties of NiO thin Film Prepared by Sol-Gel Process

Abstract:

Article Preview

The thermal decomposition behavior of gel precursor, the structure, morphology and electrochemical properties of NiO thin films prepared by sol-gel process were characterized by thermogravimetric/differential scanning calorimetry (TG-DSC), X-ray diffraction (XRD), scanning electron microscopy (SEM) and constant current charge-discharge techniques. The results show that the gel precursor completely decomposes and gradually forms the nanocrystalline NiO at 450°C during the sintering. The NiO thin film is smooth, uniform and free of cracks drying at 200°C as pretreatment and sintering at a low temperature rise rate. The structure of NiO films sintered at 500°C for 2h becomes integrity, whose discharge capacity after 20 cycles remains at 714mAh/g. It is promising to be used in Li-ion battery for great initial specific capacity and well cycle performances.

Info:

Periodical:

Advanced Materials Research (Volumes 194-196)

Edited by:

Jianmin Zeng, Taosen Li, Shaojian Ma, Zhengyi Jiang and Daoguo Yang

Pages:

2487-2490

DOI:

10.4028/www.scientific.net/AMR.194-196.2487

Citation:

J. N. Zhu et al., "Electrochemical Properties of NiO thin Film Prepared by Sol-Gel Process", Advanced Materials Research, Vols. 194-196, pp. 2487-2490, 2011

Online since:

February 2011

Export:

Price:

$35.00

In order to see related information, you need to Login.

In order to see related information, you need to Login.