Dielectric Properties of Zn-Doped CCTO Ceramics by Sol-Gel Method
The CaCu3-xZnxTi4O12 (CCZTO) (x=0, 0.06, 0.1, 0.2) ceramics were prepared by Sol–gel method. The XRD pattern shows that crystal structure of the sample with no Zn is basically single-phase. The SEM results indicate that the samples have porous structures and the gain size decreases with the content of Zn increasing. The dielectric properties of CCZTO were analyzed by Agilent 4294A. The experimental results show that the dielectric constants are less than that in other papers reported obviously because of their mesoporous structures. With the little doping amount(x=0.06, 0.1), a sharp decrease happened in the dielectric constant (εr). The higher εr was found when x=0.2, but its dielectric loss (D) had greatly increased and frequency stability of dielectric property became worse. The uniformity of gains was put forward to explain the results which showed great impact on the dielectric constant.
Huaiying Zhou, Tianlong Gu, Daoguo Yang, Zhengyi Jiang, Jianmin Zeng
D. Xu et al., "Dielectric Properties of Zn-Doped CCTO Ceramics by Sol-Gel Method", Advanced Materials Research, Vols. 197-198, pp. 302-305, 2011