Log Defect Detection Based on Wavelet De-Noising and Mathematical Morphological Optimization Algorithm

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Periodical:

Advanced Materials Research (Volumes 219-220)

Edited by:

Helen Zhang, Gang Shen and David Jin

Pages:

420-423

DOI:

10.4028/www.scientific.net/AMR.219-220.420

Citation:

N. X. Yang and D. W. Qi, "Log Defect Detection Based on Wavelet De-Noising and Mathematical Morphological Optimization Algorithm", Advanced Materials Research, Vols. 219-220, pp. 420-423, 2011

Online since:

March 2011

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$35.00

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