Physical Property Evaluation for High Purity Niobium and Tantalum Rare Metals

Abstract:

Article Preview

Thermal, electrical and mechanical properties of high purity niobium and tantalum refractory rare metals were investigated to evaluate the physical purity. Higher purity niobium and tantalum metals showed lower hardness due to smaller solution hardening effect. Temperature dependence of electrical resistivity showed a typical metallic behavior. Remarkable decrease in electrical resistivity was observed for a high purity specimen at low temperature. However, thermal conductivity increased for a high purity specimen, and abrupt increase in thermal conductivity was observed at very low temperature, indicating typical temperature dependence of thermal conductivity for high purity metals. It can be known that reduction of electron-phonon scattering leads to increase in thermal conductivity of high purity niobium and tantalum metals at low temperature.

Info:

Periodical:

Advanced Materials Research (Volumes 26-28)

Edited by:

Young Won Chang, Nack J. Kim and Chong Soo Lee

Pages:

1059-1062

Citation:

I. H. Kim et al., "Physical Property Evaluation for High Purity Niobium and Tantalum Rare Metals", Advanced Materials Research, Vols. 26-28, pp. 1059-1062, 2007

Online since:

October 2007

Export:

Price:

$38.00

[1] H. Eiji and U. Yoshidake: Metals, Vol. 72, No. 8 (2002), p.764.

[2] F. Satoshi, N. Isamu and N. Chouju: Electronic Materials, Vol. 31, No. 1 (1992), p.45.

[3] E. Hashimoto and Y. Ueda: Purification process and characterization of ultra high purity metal, Springer-Verlag, Tokyo (2001), p.249.

[4] M. Lovell, A. Avery and M. Vernon: Physical properties of materials, Van Nostrand Reinhold Co. Ltd., New York (1976), ch. 7.

[5] C. Kittel: Introduction to solid state physics, John Wiley & Sons, New York (1986), ch. 6.

[6] P. D. Desal, T. K. Chu, H. M. James and C. Y. Ho: J. Phys. Chem. Ref. Data, Vol. 13, No. 4 (1984), p.1069.

[7] K. Mimura, Y. Ishikawa, M. Isshiki and M. kato: Mater. Trans. JIM, Vol. 38, No. 8 (1997), p.714.