Defect Induced by Heated Treatment in Silica Fiber Material


Article Preview

In this paper, defect induced by heated treatment in silica is studied. The formation process of defect is analyzed by the thermodynamic model. The results show that defect can be produced by thermal treatment process. The concentration of defect can be affected by many factors. The defect formation induced by heated treatment is related to the initial precursors. To pure silica glass, the precursors mainly come from the strained bonds of network. It can produce centers and nonbridging oxygen hole centers (NBOHCs). These defects are also related to the temperature of heated treatment and the conversion frequency between precursors and defects. The changes of defect concentration with temperature and conversion frequency are also discussed in detail.



Edited by:

Jerry Tian




Z. Y. Xiao et al., "Defect Induced by Heated Treatment in Silica Fiber Material", Advanced Materials Research, Vol. 304, pp. 160-164, 2011

Online since:

July 2011




[1] H. Masaaki, N. Tetsuya, O. Toshiaki, and O. Masashi, IEEE Journal on Selected Topics in Quantum Electronics, 15(2009), p.103.

[2] S. Jung, T. Ha, H. Park, H. Kim, W. Seo, and Y. Lim, Journal of Electroceramics, 25(2010), p.140.

[3] L. Skuja, J. Non-Cryst. Solids, 239 (1998), p.16.

[4] K. Saito and A.J. Ikushima, Journal of applied physics, 91(2002), p.4886.

[5] S. Agnello and L. Nuccio, Physical review B, 73(2006), p.115203.

[6] D. LGriscom, in Defects in glasses, edited by F.L. Galeener, D.L. Griscom, and M.J. Weberf, materials research society, Pittsburgh, 1986, p.213.

[7] D.L. Griscom, Reviews of Solid State Science 4, 1990, p.565.

[8] J.X. Wen, W.Y. Luo, Z.Y. Xiao, T.Y. Wang, Z.Y. Chen, X.L. Zeng, Journal of Applied Physics, 107(2010), p.044904.

[9] K. Saito and A.J. Ikushima, Journal of applied physics, 86(1999), p.3497.

[10] T.Y. Wang, Z.Y. Xiao, and W.Y. Luo, IEEE Transactions on Nuclear Science, 55(2008), p.2685.

[11] H. Hanafusa, Y. Hibino, and F. Yamamoto, Journal of applied physics, 58(1985), p.1356.

[12] Y. Hibino, H. Hanafusa, Journal of applied physics, 60(1986), p.1797.