Multilayer Synthesized CuInSi Composite Film by Magnetron Sputtering

Abstract:

Article Preview

Using magnetron sputtering technology, the CuInSi nanocomposite thin films were prepared by multilayer synthesized method. The structure of CuInSi nanocomposite films was detected by X-ray diffraction (XRD), the peak of main crystal phase is at 2θ=42.180°; the morphology of the film surface was studied by SEM. The SEM images show that the crystalline of the film prepared by multilayer synthesized method was granulated, differed from the needle shape which was the morphology of the CuInSi film prepared by magnetron co-sputtering.

Info:

Periodical:

Advanced Materials Research (Volumes 383-390)

Edited by:

Wu Fan

Pages:

2770-2773

DOI:

10.4028/www.scientific.net/AMR.383-390.2770

Citation:

J. S. Xie et al., "Multilayer Synthesized CuInSi Composite Film by Magnetron Sputtering", Advanced Materials Research, Vols. 383-390, pp. 2770-2773, 2012

Online since:

November 2011

Export:

Price:

$35.00

In order to see related information, you need to Login.

In order to see related information, you need to Login.