Semiconductor Lasers Based on the Orthogonal Dual Gloss Meter

Abstract:

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The surface brightness values in different directions are different, the measurement of the existing optical gloss meter only once can not simultaneously achieve measurement from different directions, for this phenomenon using orthogonal pairs of optical measurement method, two groups of measurements should be averaged. Measuring probe is made of a 2kHz pulse modulation circuit, silicon photovoltaic cells, I / V conversion, high-pass filter, such as precision rectifier circuit. Measurement probe output signal by the dual analog switch and the ADC into the computer. System software using VB, can realize to show the average computation, numerical analysis and results of statistical functions. Semiconductor laser light source eliminates the need of optical collimating lens. Measurement of laser modulation frequency is 2kHz, much higher than the environmental stray light, using techniques based on frequency domain interference with satisfactory light scattering resisting effect,the test shows that the error caused by stray light is less than 1.5% ,when the instrument works open-ended in the light path.

Info:

Periodical:

Advanced Materials Research (Volumes 383-390)

Edited by:

Wu Fan

Pages:

6297-6302

DOI:

10.4028/www.scientific.net/AMR.383-390.6297

Citation:

Y. H. Gao et al., "Semiconductor Lasers Based on the Orthogonal Dual Gloss Meter", Advanced Materials Research, Vols. 383-390, pp. 6297-6302, 2012

Online since:

November 2011

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Price:

$35.00

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