Preparation and Characterization of CdS by Evaporation and Cu2S Complex Photoelectric Thin Films

Abstract:

Article Preview

Cadmium sulfide (CdS) film by evaporation deposition and CdS/Cuprous sulfide (Cu2S) complex film by dipping were obtained on glass substrates. The influence of different annealing temperatures was investigated. Scanning electron microscopy (SEM) demonstrates CdS films are continuous, homogeneous. X-ray diffraction (XRD), photoluminescence (PL) and Raman spectra reveal the CdS films were hexagonal structure and 400°C is favor of the crystallization and aggregation. The conductivity of CdS/Cu2S complex film is better than that of CdS film.

Info:

Periodical:

Advanced Materials Research (Volumes 479-481)

Edited by:

Wenzhe Chen, Pinqiang Dai, Yonglu Chen, Qianting Wang and Zhengyi Jiang

Pages:

133-136

DOI:

10.4028/www.scientific.net/AMR.479-481.133

Citation:

S. N. Sun et al., "Preparation and Characterization of CdS by Evaporation and Cu2S Complex Photoelectric Thin Films", Advanced Materials Research, Vols. 479-481, pp. 133-136, 2012

Online since:

February 2012

Export:

Price:

$35.00

[1] R. Lozada-Morales, O. Zelaya-Angel, G. Torres-Delgado: Appl. Phys. A. Vol. 73 (2001), pp.61-65.

[2] Hyun S K, Myoung H L, Nak C J, et al: J Am Chem Soc. Vol. 128 (2006), pp.15070-15071.

[3] Shur M S, Rumyantsev S, Gaska R, et al: Solid-State Electronics. Vol 46 (2002), p.1417.

[4] Xu Su, Tao Liu, et al: Chinese Journal of Inorganic Chemistry. Vol. 22 (7) (2006), pp.1163-1169.

[5] Yanmao Dong: Journal of Functional Materials and Devices. Vol. 12 (2) 2006, pp.63-168.

[6] Dan Li, Guohong Ma, et al: Acta Optica Sinica. Vol. 22 ( 6) (2002), pp.688-691.

[7] Pedro M. S. Ferreira, Ana BarrosTimmons, Márcia C. Neves, et al: Thin Solid Films. Vol. 389 (2001), pp.272-277.

[8] Pan H, Poh C K, Zhu Y W, et al: J Phys Chem C. Vol. 112 (2008), pp.11227-11230.

[9] B. CAPOEN, T. GACOIN, J.M. NEDELEC, et al: J. Mater. Sci. Vol. 36 (2001), pp.2565-2570.

[10] A. Vadivel Murugan, R.S. Sonawane, B.B. Kale, et al: Materials Chemistry and Physics. Vol 71 (2001), pp.98-102.

[11] A. Pan, R. Liu, Q. Yang, Y. Zhu, G. Yang, B. Zou and K. Chen: J. Phys. Chem. B, Vol 109  (2005), p.24268.

In order to see related information, you need to Login.