Preparation and Characterization of CdS by Evaporation and Cu2S Complex Photoelectric Thin Films


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Cadmium sulfide (CdS) film by evaporation deposition and CdS/Cuprous sulfide (Cu2S) complex film by dipping were obtained on glass substrates. The influence of different annealing temperatures was investigated. Scanning electron microscopy (SEM) demonstrates CdS films are continuous, homogeneous. X-ray diffraction (XRD), photoluminescence (PL) and Raman spectra reveal the CdS films were hexagonal structure and 400°C is favor of the crystallization and aggregation. The conductivity of CdS/Cu2S complex film is better than that of CdS film.



Advanced Materials Research (Volumes 479-481)

Edited by:

Wenzhe Chen, Pinqiang Dai, Yonglu Chen, Qianting Wang and Zhengyi Jiang




S. N. Sun et al., "Preparation and Characterization of CdS by Evaporation and Cu2S Complex Photoelectric Thin Films", Advanced Materials Research, Vols. 479-481, pp. 133-136, 2012

Online since:

February 2012




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