Radius Measurement of Tegular Rounded Material Based on Sublevel Concentration Sample Method

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Radius measurement is based on sublevel concentration sample method for the tegular rounded material, which analyzes its mathematical model and principal, while the measurement error is also discussed. In the measurement, at first, capture image of the material by image capturing card, extract edge of the material with image processing technique, scan out coordinate of the point that is on top of edge. Then choose three points which have a considerable distance in between as sampling ones, find out coordinate of circle center by computer software programming and measure out the exact pixel value of radius. Final pixel value is deal with data calibration, after which actual value of radius of tegular rounded material can therefore be obtained. Through the analysis of measurement result, the maximum deviation is not strayed from the uncertainty and the error is less.

Info:

Periodical:

Advanced Materials Research (Volumes 588-589)

Edited by:

Lawrence Lim

Pages:

1023-1027

Citation:

Y. Q. Li and R. Wang, "Radius Measurement of Tegular Rounded Material Based on Sublevel Concentration Sample Method", Advanced Materials Research, Vols. 588-589, pp. 1023-1027, 2012

Online since:

November 2012

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$38.00

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