An Auto-Test System Based on VEE for the Improvemet of Target Position Precision

Abstract:

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The influence of amplitude and phase errors on precision of target position is analysed. To reduce amplitude and phase errors, iterative algorithm is applied in calibration. In this algorithm, amplitude and phase characteristics of all microwave components need to be tested.In this paper ,an auto-test system developed in VEE and based on GPIB serial bus technology is introduced. Compared with the traditional manual testing method, the anto-test system improves efficiency and accuracy on the test of digital attenuator and phase shifter with high resolution.

Info:

Periodical:

Advanced Materials Research (Volumes 588-589)

Edited by:

Lawrence Lim

Pages:

953-956

Citation:

M. Wei et al., "An Auto-Test System Based on VEE for the Improvemet of Target Position Precision", Advanced Materials Research, Vols. 588-589, pp. 953-956, 2012

Online since:

November 2012

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$38.00

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