Multi-Parameter Test System Based on the Microcontroller and Labview

Abstract:

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It put forward the design scheme of the multi-parameter data acquisition based on the existing sensors and related test equipment in laboratory. The system selected the acceleration and speed signals as the measured parameters. The PC computer was taken as the host computer and the PCI-6014 data acquisition card was used to achieve the data collection, analysis, storage and display of various parameters. At the same time the host computer sent the control signal to SCM. The SCM of AT89S52 was used as the slave computer to receive the control signal from the host computer and give an alarm signal. To achieve the real-time control for the data acquisition, the communication between the host and slave computer was achieved via the RS232 serial communication technology.

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Periodical:

Edited by:

Liangzhong Jiang

Pages:

329-332

Citation:

S. Z. Xu et al., "Multi-Parameter Test System Based on the Microcontroller and Labview", Advanced Materials Research, Vol. 590, pp. 329-332, 2012

Online since:

November 2012

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$38.00

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