TEM and STEM Electron Tomography Analysis of Amorphous Alloys CoP-CoNiP System

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This paper covers the analysis of amorphous alloys CoP-CoNiP system by means of high-resolution transmission electron microscopy (HRTEM), scanning transmission electron microscopy and electron tomography. The last years have seen a sufficient progress in the analysis of nanomaterials structure with the help of high resolution tomography. This progress was motivated by the development of microscopes equipped with aberration correctors and specialized sample holders which allow reaching the tilts angles up to ±80°. The opportunities delivered by the method of electron tomography sufficiently grow when producing high resolution images and using chemical analysis, such as X-Ray energy-dispersive microanalysis and electron energy loss spectroscopy (EELS).

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Periodical:

Edited by:

Liangzhong Jiang

Pages:

9-12

DOI:

10.4028/www.scientific.net/AMR.590.9

Citation:

T. Mekhantseva et al., "TEM and STEM Electron Tomography Analysis of Amorphous Alloys CoP-CoNiP System", Advanced Materials Research, Vol. 590, pp. 9-12, 2012

Online since:

November 2012

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$38.00

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