Effect of Surface Film on the Al Whisker Fabrication by Utilizing Stress Migration

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The effect of surface film on the Al whisker fabrication by utilizing stress migration was investigated. The sample was a thin aluminum film deposited on an oxidized silicon substrate and covered with a surface film. Aluminum oxide layer, silicon oxide layer and Cu oxide layer were used as the surface films. Al whiskers were obtained only in the samples with aluminum oxide layer and silicon oxide layer after heat treatment. It was found that both the brittle surface films and compressive stress determined the Al whisker growth.

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Edited by:

Dayun Xu

Pages:

110-113

Citation:

Y. B. Lu and M. Saka, "Effect of Surface Film on the Al Whisker Fabrication by Utilizing Stress Migration", Advanced Materials Research, Vol. 630, pp. 110-113, 2013

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December 2012

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$38.00

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