Study of PDMS Compounds Using the Adhesion Force Determined by AFM Force Distance Curve Measurements


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The atomic force microscope(AFM) was used to perform surface force measurements in contact mode to investigate surface properties of model systems at the nanoscale. Three different Polydimethylsiloxane (PDMS) compounds were observed. The first consisted of pure PDMS, the second of PDMS blend with the nanoparticles Zinc Oxide(PDMS/ZnO) and the third of PDMS blend with the nanoparticles Zinc Oxide and toluene solvent(PDMS/ZnO/toluene), respectively. Surface morphology and the adhesion force were investigated by using atomic force microscopy. Force–distance curve measurement was performed in a contact mode, which used tip as silicon nitride. Moreover, we found a significantly different of the adhesion force when modified by nanoparticles ZnO and toluene solvent.



Advanced Materials Research (Volumes 93-94)

Edited by:

S. Suttiruengwong and W. Sricharussin




S. Vanitparinyakul et al., "Study of PDMS Compounds Using the Adhesion Force Determined by AFM Force Distance Curve Measurements", Advanced Materials Research, Vols. 93-94, pp. 141-144, 2010

Online since:

January 2010




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