Thermoelectricity of p-NCO and n-ZAO Thin Films


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Thin films of sodium cobalt oxide and zinc aluminium oxide were prepared onto ceramic substrates by a bipolar pulsed-dc magnetron sputtering system using a NaCoO2 target and a ZnAlO target, respectively, under an argon atmosphere. Energy dispersive spectroscopy analysis revealed that the as-deposited films from the NaCoO2 target comprised Na, Co, O elements, while those from the ZnAlO target contained Zn, Al, O elements. Cross-sectional view estimation by the scanning electron microscope indicated that the as-deposited Na-Co-O (NCO) and Zn-Al-O (ZAO) films had the thickness of 0.63 μm and 0.58 μm, respectively. X-ray diffraction analysis showed that the NCO thin films were grown in amorphous phase while the ZAO thin films exhibited hexagonal structure. From thermoelectric properties measurement, the p-NCO and n-ZAO films were found to exhibit the thermoelcectric power factor of 0.03 and 14.39 μW/mK2, respectively. A thermoelectric module made from three pairs of the p-n thin film stripes provided the open-circuit voltage up to 26.0 mV for a temperature difference of 79.3 K. However, the module was unable to produce useful electrical current due to its high internal series resistance contributed from the NCO films.



Advanced Materials Research (Volumes 931-932)

Edited by:

Sujin Bureerat






W. Somkhunthot et al., "Thermoelectricity of p-NCO and n-ZAO Thin Films", Advanced Materials Research, Vols. 931-932, pp. 386-391, 2014

Online since:

May 2014




* - Corresponding Author

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