Thermoelectricity of p-NCO and n-ZAO Thin Films

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Thin films of sodium cobalt oxide and zinc aluminium oxide were prepared onto ceramic substrates by a bipolar pulsed-dc magnetron sputtering system using a NaCoO2 target and a ZnAlO target, respectively, under an argon atmosphere. Energy dispersive spectroscopy analysis revealed that the as-deposited films from the NaCoO2 target comprised Na, Co, O elements, while those from the ZnAlO target contained Zn, Al, O elements. Cross-sectional view estimation by the scanning electron microscope indicated that the as-deposited Na-Co-O (NCO) and Zn-Al-O (ZAO) films had the thickness of 0.63 μm and 0.58 μm, respectively. X-ray diffraction analysis showed that the NCO thin films were grown in amorphous phase while the ZAO thin films exhibited hexagonal structure. From thermoelectric properties measurement, the p-NCO and n-ZAO films were found to exhibit the thermoelcectric power factor of 0.03 and 14.39 μW/mK2, respectively. A thermoelectric module made from three pairs of the p-n thin film stripes provided the open-circuit voltage up to 26.0 mV for a temperature difference of 79.3 K. However, the module was unable to produce useful electrical current due to its high internal series resistance contributed from the NCO films.

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Periodical:

Advanced Materials Research (Volumes 931-932)

Edited by:

Sujin Bureerat

Pages:

386-391

Citation:

W. Somkhunthot et al., "Thermoelectricity of p-NCO and n-ZAO Thin Films", Advanced Materials Research, Vols. 931-932, pp. 386-391, 2014

Online since:

May 2014

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$38.00

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