MgB2 Composite Superconductors Made by Ex Situ and In Situ Process

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Generally, two basic routes called as in-situ and ex-situ process are used for composite MgB2 wires now. Mentioned processes have been used for making of single-core composite wires. The applied heat treatment parameters influence the microstructure of MgB2 phase, critical temperature and critical current density, but it has also decisive effect on the MgB2/metal reaction. It was found that the transport current densities are much more sensitive to the used sheath material than critical temperatures. The main factors limiting the transport current density are cracks introduced by deformation and porosity caused by the boron diffusion in ex-situ and in-situ wires, respectively.

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Periodical:

Edited by:

P. VINCENZINI and A. RIGAMONTI

Pages:

131-136

DOI:

10.4028/www.scientific.net/AST.47.131

Citation:

P. Kováč et al., "MgB2 Composite Superconductors Made by Ex Situ and In Situ Process", Advances in Science and Technology, Vol. 47, pp. 131-136, 2006

Online since:

October 2006

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$35.00

[1] Y. Zhao, Y. Feng, C. H. Cheng, L. Zhou, Y. Wu, T. Machi, Y. Fudamoto, N. Koshizura, M. Murakami: Appl. Phys. Lett. Vol. 79 (2001), p.1145.

[2] H. L. Suo, C. Beneduce, M. Dhallé, N. Musolino, J. E. Genoud and R. Flűkiger: Appl. Phys. Lett. Vol. 79 (2001), p.3116.

[3] M. R. Cimberle, P. Novak, P. Manfrinetti and A. Palenzona: Sup. Sci. and Technol. Vol. 15 (2002), p.43.

[4] P. Kováč, I. Hušek and T. Melišek: Sup. Sci. and Technol. Vol. 15 (2002), p.1340.

[5] X. Dou, J. Horvath, S. Soltanian, X. L. Wang, M. J. Qin, S. H. Zhou, H. K. Liu and P.G. Munroe: IEEE Trans on Appl. Supercond. Vol. 13 (2003), p.3199.

[6] B. Q. Fu, Y. Feng, G. Yang, C. F. Liu, L. Zhou, L. Z. Cao, K. Q. Ruan, X. G. Li: Physica C Vol. 392-396 (2003), p.1035.

[7] P. Kováč, I. Hušek, T. Melišek and V. Štrbík: Sup. Sci. and Technol. Vol. 18 (2005), p.856.

[8] W. Pachla, A. Presz, P. Kováč, I. Hušek and R. Diduszko: Sup. Sci. and Technol. Vol. 17 (2004), p.1289.

[9] G. Grasso, A. Malagoli, C. Ferdeghini, S. Roncallo, V. Braccini, M. R. Cimberle and A. S. Siri: Appl. Phys. Lett. Vol. 79 (2001), p.230.

DOI: 10.1063/1.1384905

[10] A. Yamamoto, J. Shimojama, S. Ueda, Y. Katsura, S. Horii, K. Kishio: Sup. Sci. and Technol. Vol. 17 (2004), p.921.

[11] H. Kumakura, A. Matsumoto, H. Fujii, K. Togano: Appl. Phys. Lett. Vol. 79 (2001), p.2435.

[12] W. Goldacker, S. I. Schlachter, C. Zimmer, H. Reiner: Sup. Sci. and Technol. Vol. 14 (2001), p.787.

[13] Y. Feng , G. Yan, Y. Zhao, C. F. Liu, B. Q. Fu, L. Zhou, L. Z. Cao, K. Q. Ruan, X. G. Li, L. Shi and Y. H. Zhang: Physica C Vol. 386 (2003), p.598.

[14] B. Q. Fu, Y. Feng, G. Yan, C. F. Liu, L. Zhou, L. Z. Cao, K. Q. Ruan, X. G. Li: Physica C Vol. 392 (2003), p.1035.

[15] P. Kováč, I. Hušek, T. Melišek, M. Kulich and V. Štrbík: will be published by Sup. Sci. and Technol. Vol. 19 (2006), p..

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