Fabrication and Magneto-Transport Properties of Zn0.88-xMgxMn0.12O/ZnO Heterostructures Grown on ZnO Single-Crystal Substrates

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The transport properties of Zn0.88-xMgxMn0.12O/ZnO modulation-doped heterostructures (x≤0.15) were investigated. The heterostructures were fabricated on ZnO single-crystal substrates by a pulsed laser deposition system. Atomic force microscope observation and X-ray diffraction analysis suggested that Zn0.88-xMgxMn0.12O layers have atomically flat surface and excellent crystallinity. The results of Hall measurement for Zn0.88-xMgxMn0.12O/ZnO modulation-doped heterostructure with x=0.075 revealed that the carrier concentration and the electron mobility were 5.1×1012cm-2 and 800 cm2/Vs at 10 K, respectively, suggesting that the carrier confinement effect exits at the heterointerface between Zn0.88-xMgxMn0.12O barrier layer and ZnO channel layer. In the magnetoresistance (MR) measurement at 1.85 K, a positive MR behavior was observed below 0.5 T, while a negative MR behavior was recognized above 0.5 T. The slope of the positive MR decreased with increasing the temperature and was well fitted to the Brillouin function with S=5/2. The electrical and magneto-transport properties were very similar to those of Zn0.88Mn0.12O/ZnO heterostructures without doping Mg.

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Edited by:

Pietro VINCENZINI, David S. GINLEY, Giovanni BRUNO, Attilio RIGAMONTI and Nikolay ZHELUDEV

Pages:

1-8

DOI:

10.4028/www.scientific.net/AST.75.1

Citation:

K. Masuko et al., "Fabrication and Magneto-Transport Properties of Zn0.88-xMgxMn0.12O/ZnO Heterostructures Grown on ZnO Single-Crystal Substrates", Advances in Science and Technology, Vol. 75, pp. 1-8, 2010

Online since:

October 2010

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$35.00

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