Ultra-violet and X-ray photo-electron spectroscopy were used to monitor the changes in surface electronic structure which occurred when monocrystalline transition metal oxides were bombarded with inert gas ions. It was found that this oxide exhibited a new type of surface defect that had not previously been observed in transition metal oxides. Whereas other transition metal oxide surfaces were reduced under particle bombardment, the present surfaces appeared to become oxidized. It was suggested that the electronic states at such defect sites would be entirely different to those on the defective surfaces of other transition metal oxides.

X.Li, V.E.Henrich: Solid State Communications, 1996, 98[8], 711-5