Plates of Sn-doped n-type material were coated with 54Mn, annealed (1100C, 4h) and analyzed by using alternate grinding and activity measurements. The diffusion profiles could be described by an erfc function, and the diffusivity at the annealing temperature was estimated to be 4.3 x 10-10cm2/s.

E.A.Skoryatina, R.S.Malkovich: Fizika i Tekhnika Poluprovodnikov, 1989, 23[1], 164-6. (Soviet Physics - Semiconductors, 1989, 23[1], 101-2)