Strained superlattices which exhibited a high degree of structural perfection were grown onto GaSb substrates. The superlattices exhibited ideal defect-free structures. Cross-sectional micrographs revealed that the layers were highly planar, regular and coherently strained with respect to the substrate. No crystalline defects were observed by using transmission electron microscopy, in spite of the existence of a lattice mismatch of almost 2%. The planarity of the layers was confirmed by the observation of Pendellösung fringes in high-resolution X-ray diffraction patterns, while the observation of numerous sharp satellite peaks indicated that essentially no interdiffusion occurred within the superlattices.

R.H.Miles, D.H.Chow, W.J.Hamilton: Journal of Applied Physics, 1992, 71[1], 211-4