Single crystals were wire-drawn into stage-III, up to the onset of stage-IV. Transmission electron microscopy revealed the usual dislocation cell structure. High-resolution X-ray diffraction line-profile analysis was carried out on the deformed specimens. The diffraction experiments provided characteristically asymmetrical line profiles. These were evaluated for the dislocation densities and arrangements, and for the residual long-range internal stresses that existed in the dislocation cell structure. The dislocation densities were found to be spatially anisotropic, and were explained in terms of anisotropic Burgers vector populations. The residual long-range internal stresses formed plane-stress states that conformed with the applied stress conditions. A microscopic model was developed which accounted, in a self-consistent manner, for both the density and arrangement of dislocations and for the residual long-range internal stresses.

A.Borbély, G.Hoffmann, E.Aernoudt, T.Ungár: Acta Materialia, 1997, 45[1], 89-98