Anodically etched porous samples were bombarded with 85MeV Ni ions. This resulted in complete suppression of the major photoluminescence peak at 697nm and of the shoulder peak at 6.7nm. In the bombarded samples, a weak peak appeared at 588nm. Elastic recoil detection analysis was used to study changes in the H concentration profiles during bombardment, and infra-red spectroscopy was used to study the effect of bombardment upon the chemical species which were present in porous material. The changes in photoluminescence spectra were correlated with the resultant changes in the concentrations of H, and chemical complexes which contained Si, H and O.

B.R.Mehta, M.K.Sahay, L.K.Malhotra, D.K.Avasthi, R.K.Soni: Thin Solid Films, 1996, 289[1-2], 95-8