The 2 components were deposited in a bi-layer configuration, with Bi or Sb as the lower layer. It was noted that the morphologies and structures of these films were very different; depending upon the order in which they were deposited. The films were annealed  in situ in a transmission electron microscope in order to study changes which were caused by interdiffusion. Grain-boundary- or lattice-controlled interdiffusion was observed; depending upon the initial film microstructure.

T.Missana, C.N.Afonso, A.K.Petford-Long, R.C.Doole: Thin Solid Films, 1996, 288[1-2], 186-92