Two aspects of this subject were considered. One of them concerned the consequences, of unintentionally poor contacts at interfaces, with regard to the frequency-dependent potential distribution and the impedance response. Finite-element calculations were used to determine the exact potential distribution. Secondly, the use of point contacts as tools for the resolution of the local environment in solids was demonstrated with respect to 2 examples: the detection of a diffusion profile, and the characterization of a highly conductive surface layer in AgCl.

J.Fleig, J.Maier: Solid State Ionics, 1996, 86-88[2], 1351-6