High-resolution electron microscopy, involving multi-slice simulation, was used to analyze the structure of new synthetic microwave dielectrics. The detailed structure that was predicted by X-ray diffractometry and Rietveld analysis was one in which lattice vacancies were preferentially located in the (002) plane of perovskite-like unit cells. The predicted structure was confirmed by comparing the high-resolution electron microscopic images with simulated images. Also, antiphase boundaries which were caused by displacements of the (002) defect planes were identified.

M.Yonemura, N.Hara, K.Kamei, T.Takada: Journal of the Japan Institute of Metals, 1996, 60[12], 1143-8