The simultaneous presence, of micro-defects of opposite dilatation sign, in Zn-doped p-type single crystals was revealed by X-ray diffuse scattering data. It was found that, in crystals which were doped to a concentration of 2.0 x 1018/cm3, micro-defects with a negative dilatation predominated. Increasing the Zn concentration to 1019/cm3 caused changes in the point-defect ensembles. The number of micro-defects decreased, and their shape changed so as to become more anisotropic. It was assumed that the nature of the micro-defects also changed. It was suggested that the micro-defects which were observed in specimens with a Zn content of 1020/cm3 formed due to interactions between dopant atoms and matrix components, and were associates of complexes that were formed from an intrinsic point defect and a dopant atom.

V.T.Bublik, K.D.Shcherbachev: Kristallografiya, 1996, 41[5], 913-7 (Crystallography Reports, 1996, 41[5], 870-4)