Ballistic electron emission microscopic imaging, and spatially resolved spectroscopic, studies were made of misfit dislocations that were 80nm below the surface. Majority-carrier scattering, by a fraction of the misfit dislocations, was found to reduce the ballistic electron emission microscopic current locally and to yield a logarithmic spatial dependence. This suggested that charging of the dislocation cores occurred.

E.Y.Lee, S.Bhargava, M.A.Chin, V.Narayanamurti, K.J.Pond, K.Luo: Applied Physics Letters, 1996, 69[7], 940-2