The X-ray line profiles, of ultra fine-grained crystals which had been produced by equal-channel angular pressing, were measured by using a high-resolution diffractometer which introduced negligible instrumental line-broadening. An analysis of the line breadths and of the Fourier coefficients showed that taking account of the contrast, which was caused by dislocations on line profiles, furnished new scaling factors for Williamson-Hall plots and Warren-Averbach analyses. When strain was produced by dislocations, a new procedure which was proposed here permitted a straightforward determination to be made of the strain in terms of the dislocation density.

T.Ungár, A.Borbély: Applied Physics Letters, 1996, 69[21], 3173-5