The D effusion spectra of crystalline B-doped (2.5 x 1017 to 1019/cm3) material were studied. By means of chemical etching of plasma-damaged surface layers, and secondary ion mass spectroscopic profiling, it was shown that the effusion rate appeared to be limited by surface desorption. It was suggested that the various effusion peaks could be attributed to specific H configurations.

D.Ballutaud, P.De Mierry, J.C.Pesant, R.Rizk, A.Boutry-Forveille, M.Aucouturier: Materials Science Forum, 1992, 83-87, 45-50